| Customization: | Available |
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| Usage: | Gateway |
| Type: | Wireless |
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ANET series of Smart IoT Gateways provides a protocol library that contains various kinds of protocols to realize the interconnection of intelligent devices of different secondary suppliers. As the communication interface equipment between the automatic system network and the monitoring equipment, this series of intelligent communication management machines has realized three functions: protocol conversion, interface matching, data conversion.
| Specification | ANet-1E1S1 | ANet-1E1S1 -LR |
ANet-1E1S1 -4G |
ANet-1E1S1 -4G/LR |
ANet-1E2S1 | ANet-1E2S1 -LR |
ANet-1E2S1 -4G |
ANet-1E2S1 -4G/LR |
ANet-2E4S1 | ANet-2E8S1 |
| Uplink | CE | CE | CE, 4G | CE, 4G | CE | CE | CE, 4G | CE, 4G | CE | CE |
| Downlink | RS485 | RS485, LORA | RS485 | RS485, LORA | RS485 | RS485, LORA | RS485 | RS485, LORA | RS485 | RS485 |
| Ethernet port | 1 | 1 | 1 | 1 | 1 | 1 | 1 | 2 | 2 | |
| Serial port | 1 | 1 | 1 | 2 | 2 | 2 | 2 | 4 | 8 | |
| Technical | Index |
| Power Voltage | AC 85 V ~265 V |
| Power Consumption | ≤10W |
| Processing element | ARM32 digit Free scale ARM9 i.MX2xx 454MHz |
| Inner board memory | 64MB DDR2 internal memory + 128MB NAND Flash + 8G SD Card Electronic hard disk |
| Serial interface | Two channels coupling isolation RS485 |
| Ethernet interface | 1 channel 10/100 self-adaption capacity |
| SD card interface | Supports SD/MMC memory cards of not less than 512 M, supports hot-plug and plug-and-play breakpoints to continue data storage |
| Safety | Power frequency withstand voltage: AC 2kV 1min between the communication terminal and auxiliary power supply |
| Insulation resistance: input, output to shape>100MΩ | |
| Environment | Working Temperature:-20ºC~+55ºC |
| Storage Transport Temperature:-25ºC~+70ºC | |
| Relative Humidity:≤95%(+25ºC) | |
| Altitude:≤2500m | |
| EMC Testing | IEC61000-4-2 ESD immunity test Class 4 |
| IEC61000-4-4 Resistance test of electric fast transient pulse group Class 4 | |
| IEC61000-4-5 Surge (shock) immunity test Class 4 | |
| IEC61000-4-6 Conductive disturbance immunity of RF field induction Class 3 |
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